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Denmark - Scanning electron microscopes - The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
Published 15 Oct 2026
15 Oct 2026
Deadline in 19 days
- Primary CPV
-
38511100 *
Laboratory, optical & precision equipment
- Location
- 🇩🇰 Denmark
- Value
- No value specified
- Contract
- Not specified
- Contract Types
-
38 *Laboratory, optical & precision equipmen...Full CPV Breakdown
- SME suitable
- Not stated
Publisher Address
Denmark · Denmark
Contact
Award Criteria
Not specified
- Bidding Documents (eu.eu-supply.com) · Bidding Documents
Related tenders
Danmarks Tekniske Universitet - DTU
All notices from this publisher Same CPV code
38511100 *
All notices with this CPV code
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.
Full CPV breakdown
- 38511100 — (primary)
Notice details
- Competition
- Open competition (any supplier can bid)
- Procurement method
- Open procedure
- Notice status
- Active
- Published
- 15 Oct 2026 00:00
- Deadline
- 16 Nov 2026 00:00
- OCID
- ted-713490-2026
Full notice record
17 detailsEverything the publisher included in this notice, organised by section.
Buyer
| Name | Danmarks Tekniske Universitet - DTU |
Organisations
| Name | Danmarks Tekniske Universitet - DTU |
| Role | buyer |
| Address › Country | Denmark |
| Address › Region (NUTS) | Denmark |
| Contact › Email | miktaa@dtu.dk |
| Link | https://www.dtu.dk |
Tender
| Title | Denmark - Scanning electron microscopes - The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source |
| Description | DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS. |
| Status | active |
| Procedure type | open |
| Procedure | Open procedure |
| Bidding period › End | 2026-11-16 |
| Item › Delivery › Region (NUTS) | Denmark |
| Item › Delivery › Country | Denmark |
| Document › Document type | Bidding documents |
| Document › Link | https://eu.eu-supply.com/app/rfq/rwlentrance_s.asp?PID=461749&TID=2004... |